Steinbichler ABIS II Optisches System / zur Oberflächeninspektion
* inkl. ges. MwSt. zzgl. Versandkosten
- Steinbichler ABIS II
- Optisches System / zur Oberflächeninspektion
- Dimensions (mm³) 670 x 80 x 100 755 x 160 x 460 incl. ABIS II sensor Weight (kg) 4.7 14.8 incl. ABIS II sensor Image Acquisition Time 0.1 msec 0.1 msec Robot Capability yes yes Field of View 220 x 300 mm² 220 x 300 mm² Data Interface GigE GigE Resolution CCD Camera (Pixel) 1200 x 1600 1200 x 1600 3D Defect Size Resolution (Depth) 10 µm (min.) surface dependant - Lateral Defect Resolution 1.5 mm surface dependant 10 µm Stand-Off Distance 432 mm +/- 20 mm 432 mm +/- 20 mm Light Source Xenon flash lamp LED Lifetime of Light Source min. 106 flashes at 1 Hz repetition frequency unlimited
Art.-ID | 5110 |
Zustand | Gebraucht |
Hersteller | A3M |
Inhalt | 1 Stück |